A bin of 5 transistors is known to contain 2 thatare

Chapter 6, Problem 6.6

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A bin of 5 transistors is known to contain 2 thatare defective. The transistors are to be tested, oneat a time, until the defective ones are identified.Denote by N1 the number of tests made until thefirst defective is identified and by N2 the number ofadditional tests until the second defective is identified.Find the joint probability mass function of N1and N2

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