The fraction of defective integrated circuits produced in

Chapter 8, Problem 59E

(choose chapter or problem)

Get Unlimited Answers
QUESTION:

The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives.

(a) Calculate a 95% two-sided CI on the fraction of defective circuits produced by this particular tool.

(b) Calculate a 95% upper confidence bound on the fraction of defective circuits.

Questions & Answers

QUESTION:

The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives.

(a) Calculate a 95% two-sided CI on the fraction of defective circuits produced by this particular tool.

(b) Calculate a 95% upper confidence bound on the fraction of defective circuits.

ANSWER:

Step 1 of 4

Given,

Sample size,

Number of defectives,

For a  proportion of observations in a random sample of size n that belongs to a class of interest the Approximate Confidence Interval on a Binomial Proportion is,

        

Add to cart


Study Tools You Might Need

Not The Solution You Need? Search for Your Answer Here:

×

Login

Login or Sign up for access to all of our study tools and educational content!

Forgot password?
Register Now

×

Register

Sign up for access to all content on our site!

Or login if you already have an account

×

Reset password

If you have an active account we’ll send you an e-mail for password recovery

Or login if you have your password back