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The fraction of defective integrated circuits produced in
Chapter 8, Problem 59E(choose chapter or problem)
The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives.
(a) Calculate a 95% two-sided CI on the fraction of defective circuits produced by this particular tool.
(b) Calculate a 95% upper confidence bound on the fraction of defective circuits.
Questions & Answers
QUESTION:
The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives.
(a) Calculate a 95% two-sided CI on the fraction of defective circuits produced by this particular tool.
(b) Calculate a 95% upper confidence bound on the fraction of defective circuits.
ANSWER:
Step 1 of 4
Given,
Sample size,
Number of defectives,
For a proportion of observations in a random sample of size n that belongs to a class of interest the Approximate Confidence Interval on a Binomial Proportion is,