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A semiconductor manufacturer collects data from a new tool
Chapter 9, Problem 2E(choose chapter or problem)
A semiconductor manufacturer collects data from a new tool and conducts a hypothesis test with the null hypothesis that a critical dimension mean width equals 100 nm. The conclusion is to not reject the null hypothesis. Does this result provide strong evidence that the critical dimension mean equals 100 nm? Explain.
Questions & Answers
QUESTION:
A semiconductor manufacturer collects data from a new tool and conducts a hypothesis test with the null hypothesis that a critical dimension mean width equals 100 nm. The conclusion is to not reject the null hypothesis. Does this result provide strong evidence that the critical dimension mean equals 100 nm? Explain.
ANSWER:Step 1 of 2
A statistical hypothesis is a statement about the parameters of one or more populations. There will be two statements, a null hypothesis and an alternative hypothesis 
Testing of hypothesis procedures depends upon using the information in a random sample from the population of interest. We will either reject or do not reject the null hypothesis based upon whether this information is consistent or inconsistent with the null hypothesis.