An article in the Journal of Electronic Material [Progress in CdZnTe Substrate
Chapter 9, Problem 9-146(choose chapter or problem)
An article in the Journal of Electronic Material [Progress in CdZnTe Substrate Producibility and Critical Drive of IRFPA Yield Originating with CdZnTe Substrates (1998, Vol. 27, No. 6, pp. 564572)] improved the quality of CdZnTe substrates used to produce the HgCdTe infrared focal plane arrays (IRFPAs), also defined as sensor chip assemblies (SCAs). The cut-on wavelength on 11 wafers was measured and is shown below: 6.06 6.16 6.57 6.67 6.98 6.17 6.17 6.93 6.73 6.87 6.76 (a) Is there evidence that the mean of cut-on wave length is not ? (b) What is the P-value for this test? (c) What sample size would be required to detect a true mean cut-on wavelength of with probability 95%? (d) What is the type II error probability if the true mean cut-on wavelength is ?
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