To create images of samples at the molecular level, atomic force microscopes use silicon
Chapter 6, Problem 9(choose chapter or problem)
To create images of samples at the molecular level, atomic force microscopes use silicon micro-cantilevers that obey Hookes Law F (x) = kx, where x is the distance through which the tip is deflected (Figure 6). Suppose that 1017 J of work are required to deflect the tip a distance 108 m. Find the deflection if a force of 109 N is applied to the tip.
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