An article in the Journal of Electronic Material
Chapter 9, Problem 166SE(choose chapter or problem)
Problem 166SE
An article in the Journal of Electronic Material [“Progress in CdZnTe Substrate Producibility and Critical Drive of IRFPA Yield Originating with CdZnTe Substrates” (1998, Vol. 27(6), pp. 564–572)] improved the quality of CdZnTe substrates used to produce the HgCdTe infrared focal plane arrays (IRFPAs) also defined as sensor chip assemblies (SCAs). The cut-on wavelength (µm) on 11 wafers was measured and follows:
6.06 6.16 6.57 6.67 6.98 6.17 6.17 6.93 6.73 6.87 6.76
(a) Is there evidence that the mean of cut-on wavelength is not 6.25µm ?
(b) What is the P-value for this test?
(c) What sample size would be required to detect a true mean cut-on wavelength of 6.25 µm with probability 95%?
(d) What is the type II error probability if the true mean cut-on wavelength is 6.95µm?
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