Solved: The article Limited Yield Estimation for Visual DefectSources (IEEE Trans. on
Chapter 7, Problem 19(choose chapter or problem)
The article Limited Yield Estimation for Visual DefectSources (IEEE Trans. on Semiconductor Manuf., 1997:1723) reported that, in a study of a particular wafer inspectionprocess, 356 dies were examined by an inspectionprobe and 201 of these passed the probe. Assuming a stableprocess, calculate a 95% (two-sided) confidence interval forthe proportion of all dies that pass the probe.
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