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Testing electronic circuits. Japanese researchers have
Chapter 8, Problem 39E(choose chapter or problem)
Problem 39E
Testing electronic circuits. Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding (IEICE Transactions on Information & Systems, Jan. 2005). The new method is designed to reduce the time required for input decompression and output compression—called the compression ratio. Experimental results were obtained by testing a sample of 11 benchmark circuits (all of different sizes) from a SUN Blade 1000 workstation. Each circuit was tested using the standard compression/depression method and the new Huffman-based coding method, and the compression ratio was recorded. The data are given in the accompanying table. Compare the two methods with a 95% confidence interval. Which method has the smaller mean compression ratio?
Questions & Answers
QUESTION:
Problem 39E
Testing electronic circuits. Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding (IEICE Transactions on Information & Systems, Jan. 2005). The new method is designed to reduce the time required for input decompression and output compression—called the compression ratio. Experimental results were obtained by testing a sample of 11 benchmark circuits (all of different sizes) from a SUN Blade 1000 workstation. Each circuit was tested using the standard compression/depression method and the new Huffman-based coding method, and the compression ratio was recorded. The data are given in the accompanying table. Compare the two methods with a 95% confidence interval. Which method has the smaller mean compression ratio?
ANSWER:
Step 1 of 3
Japanese researchers have developed a compression/depression method of testing electronic circuits based on Huffman coding. The new method is designed to reduce the time required for input decompression and output compression - called the compression ratio. Experimental results were obtained by testing a sample of 11 benchmark circuits. Each circuit was tested using the standard compression/depression method and the new Huffman-based coding method.
To compare the two methods, we use 95% confidence interval for the mean difference between both the methods.
The following table gives the necessary values used in the formulae.
