Solution Found!
Failure times of silicon wafer microchips. Refer to
Chapter 12, Problem 129E(choose chapter or problem)
Failure times of silicon wafer microchips. Refer to the National Semiconductor study of manufactured silicon wafer integrated circuit chips, Exercise 12.63 (p. 706). Recall that the failure times of the microchips (in hours) was determined at different solder temperatures (degrees Celsius). The data are repeated in the table in the next column.
a. Fit the straight-line model \(E(y)=\beta_0+\beta_1 x\) to the data, where y = failure time and x = solder temperature.
b. Compute the residual for a microchip manufactured at a temperature of \(149^{\circ} \mathrm{C}\).
c. Plot the residuals against solder temperature (x). Do you detect a trend?
d. In Exercise 12.63c, you determined that failure time(y) and solder temperature (x) were curvilinearly related. Does the residual plot, part c, support this conclusion?
Questions & Answers
QUESTION:
Failure times of silicon wafer microchips. Refer to the National Semiconductor study of manufactured silicon wafer integrated circuit chips, Exercise 12.63 (p. 706). Recall that the failure times of the microchips (in hours) was determined at different solder temperatures (degrees Celsius). The data are repeated in the table in the next column.
a. Fit the straight-line model \(E(y)=\beta_0+\beta_1 x\) to the data, where y = failure time and x = solder temperature.
b. Compute the residual for a microchip manufactured at a temperature of \(149^{\circ} \mathrm{C}\).
c. Plot the residuals against solder temperature (x). Do you detect a trend?
d. In Exercise 12.63c, you determined that failure time(y) and solder temperature (x) were curvilinearly related. Does the residual plot, part c, support this conclusion?
ANSWER:Step 1 of 6
For the given information, the failure times of the microchips (in hours) were determined
at different solder temperatures (degrees Celsius).