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The number of contaminating particles on a silicon wafer
Chapter 2, Problem 19E(choose chapter or problem)
The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample of size 100, resulting in the following frequencies: a. ?What proportion of the sampled wafers had at least one particle? At least five particles? b. ?What proportion of the sampled wafers had between five and ten particles, inclusive? Strictly between five and ten particles? c. ?Draw a histogram using relative frequency on the vertical axis. How would you describe the shape of the histogram?
Questions & Answers
QUESTION:
The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample of size 100, resulting in the following frequencies: a. ?What proportion of the sampled wafers had at least one particle? At least five particles? b. ?What proportion of the sampled wafers had between five and ten particles, inclusive? Strictly between five and ten particles? c. ?Draw a histogram using relative frequency on the vertical axis. How would you describe the shape of the histogram?
ANSWER:Problem 19E Answer: Step1: We have The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample of size 100, resulting in the following frequencies: Number of 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 Particles Frequency 1 2 3 12 11 15 18 10 12 4 5 3 1 2 1 We need to find, a. What proportion of the sampled wafers had at least one particle At least five particles b. What proportion of the sampled wafers had between five and ten particles, inclusive Strictly between five and ten particles c. Draw a histogram using relative frequency on the vertical axis. How would you de