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The standard deviation of critical dimension thickness in
Chapter 9, Problem 3E(choose chapter or problem)
The standard deviation of critical dimension thickness in semiconductor manufacturing is
(a) State the null and alternative hypotheses used to demonstrate that the standard deviation is reduced.
(b) Assume that the previous test does not reject the null hypothesis. Does this result provide strong evidence that the standard deviation has not been reduced? Explain.
Questions & Answers
QUESTION:
The standard deviation of critical dimension thickness in semiconductor manufacturing is
(a) State the null and alternative hypotheses used to demonstrate that the standard deviation is reduced.
(b) Assume that the previous test does not reject the null hypothesis. Does this result provide strong evidence that the standard deviation has not been reduced? Explain.
ANSWER:Step 1 of 4
A statistical hypothesis is a statement about the parameters of one or more populations. There will be two statements, a null hypothesis and an alternative hypothesis 
Testing of hypothesis procedures depends upon using the information in a random sample from the population of interest. We will either reject or do not reject the null hypothesis based upon whether this information is consistent or inconsistent with the null hypothesis.